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CEA-Leti showcases integrated optics on silicon for high-speed communication

Automated wafer level electro-optical probe testing of silicon photonics

Automated wafer-level electro-optical probe testing of silicon photonics
Credit: CEA- Leti

In a paper at Photonics West, CEA-Leti scientists showcased research results that push the boundaries of high-speed communication with silicon photonics

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