Top technical expert to aid organization in capitalizing on test and measurement opportunities
BEAVERTON, OR – The Ethernet Alliance, a global consortium dedicated to the continued success and advancement of Ethernet technologies, named David J. Rodgers of Teledyne LeCroy to its Board of Directors. A recognized technical expert in test and measurement, Mr. Rodgers’ appointment increases the board’s overall diversity and helps the organization address the Ethernet-driven advances occurring in test and measurement.
“There’s a symbiotic relationship between Ethernet and test and measurement, with advancements in one driving changes to the other. Meeting the test and measurement needs of emerging applications enabled by new Ethernet speeds is critical to their adoption and deployment,” said John D’Ambrosia, chairman, Ethernet Alliance; and senior principal engineer, Huawei. “Utilizing David’s vast expertise enables us to address another critical area of the Ethernet ecosystem, in turn allowing us to better serve both the Ethernet and test and measurement communities. His valuable insight is a welcome addition.”
Mr. Rodgers, Senior Product Marketing Manager, Teledyne LeCroy, focuses on defining, designing, deploying, and marketing high-speed serial analysis test and measurement products for Ethernet and Fibre Channel SANs and LANs. A 30-year industry veteran, he is a member of industry groups and organizations including the Fibre Channel Industry Association (FCIA); PCI special interest group (PCI-SIG®); and NVM Express (NVMe) special interest group.
“With the evolution of new Ethernet speeds, markets, and applications, test and measurement is evolving as well. As the strength of technology standards lies in their ability to be validated through test and measurement processes, it’s incumbent the Ethernet ecosystem take an active interest in the development and use of effective test and measurement tools,” said Mr. Rodgers. “I look forward to working with the Ethernet Alliance board to tackle new Ethernet-related test and measurement challenges.”