Anritsu has introduced the G0361A, a 64Gbaud two-bit digital to analogue converter (DAC) with dual-channel 2x1 multiplexers.
When connected to the MP1800A signal quality analyser, it creates what the company claims is the industry’s first test set-up that supports signal generation and bit error rate (BER) tests for high baud rate signals, such as 128G PAM4 (four-level pulse amplitude modulation).
This combination eliminates the complex setup and configuration issues associated with legacy systems while also minimising capital equipment costs, for more efficient testing of the next-generation of high-speed devices, modules, and systems, including 400 Gigabit Ethernet.
The MP1800A is a flexible platform that incorporates built-in pulse pattern generator (PPG) modules for generation of high-quality, high-amplitude signals, as well as a high-sensitivity error detector (ED) module. Each MP1800A PPG or ED module comes with one, two or four channels to support multichannel synchronisation of up to eight channels in total, each at 32Gb/s.
The G0361A connects with any of the MP1800A 28G/32G multi-channel PPG modules. With a dual-channel 2x1 multiplexing function in the input section, the G0361A can generate signals ranging from four-channel x 32Gb/s non-return to zero (NRZ) to 128G PAM4 (64Gbaud). The 128 PAM4 signals can be generated using half-rate 32Gb/s x 4 input rather than a pair of 64Gb/s signals. In combination with the MP1800A, synchronised multiple 128G PAM4 signals are supported.
“With the introduction of the new DAC, the MP1800A BERT continues to support the needs of engineers designing the next-generation of high-speed products, including interconnects and backplanes,” Anritsu said in a statement.